The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 15, 1999
Filed:
Oct. 01, 1997
Applicant:
Inventors:
Assignee:
Applied Spectral Imaging Ltd, Migdal Haemek, IL;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
C12M / ; G02B / ; F21V / ;
U.S. Cl.
CPC ...
4352872 ; 359368 ; 252582 ;
Abstract
A method and hardware for chromosome classification by decorrelation statistical analysis to provide color (spectral) karyotypes and to detect chromosomal aberrations. The method and hardware employ a set of N decorrelation matched filters for chromosome classification. The N decorrelation matched filters are dedicated for extracting decorrelated spectral data from chromosome samples painted according to a specific experimental protocol. The N decorrelation matched filters being described by: ##EQU1## where V.sub.ik min equals minimum V.sub.ik over all i, and V.sub.ik max equals maximum V.sub.ik over all i, and wherein N is an integer greater than two.