The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 08, 1999

Filed:

May. 30, 1997
Applicant:
Inventor:

Byoung-Jin Kim, Suwon, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F / ;
U.S. Cl.
CPC ...
371 211 ;
Abstract

A test device for testing a plurality of Digital Signal Processor Integrated Circuits Incorporated as a finished product in a digital video apparatus comprises: a plurality of Digital Signal Processor Integrated Circuits (DSP ICs) for processing a signal from a test signal generator as a digital signal and outputting the digitally processed signal, the test signal generator being disposed at an input end of the plurality of DSP ICs; a monitor for monitoring an output from the DSP IC being tested. It is possible to check in a simple manner the operating state of each IC connected to other DSP ICs as well as the production and assembly state of the PCB as a finished digital video apparatus. Furthermore, it is possible to check for damage of the parts or an error which may be generated during connection of the ICs to the lines on the PCB in the manufacturing of the products as well as defects caused during shipping of assembled IC components in a DSP apparatus.


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