The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 08, 1999

Filed:

May. 08, 1997
Applicant:
Inventor:

Philip F Marino, Rochester, NY (US);

Assignee:

Eastman Kodak Company, Rochester, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11B / ;
U.S. Cl.
CPC ...
369 58 ; 369 4432 ;
Abstract

Apparatus for measuring warp of an optical disk is disclosed. The apparatus includes an actuator having a base and a moveable lens holder, the lens holder being moveable in a vertical direction relative to the base. The apparatus further includes a structure for moving the actuator to selected positions relative to the surface of the disk and for measuring the vertical displacement of the disk surface relative to the actuator base at each of the selected positions, a structure for providing displacement signals corresponding to the vertical displacement of the disk surface at each of the selected positions, and a structure responsive to the displacement signals for computing a radial tilt matrix and a tangential tilt matrix of optical disk surface tilt values, the matrices representing the warp of the surface of the disk.


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