The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 08, 1999
Filed:
Oct. 23, 1997
Applicant:
Inventors:
Brian L Brown, SugarLand, TX (US);
David R Brown, SugarLand, TX (US);
Daniel B Penney, Houston, TX (US);
Roger D Norwood, SugarLand, TX (US);
Assignee:
Texas Instruments Incorporated, Dallas, TX (US);
Primary Examiner:
Int. Cl.
CPC ...
G11C / ;
U.S. Cl.
CPC ...
365201 ; 36523003 ;
Abstract
Testing of an integrated circuit having arrays of memory cells occurs by writing to all of the arrays at the same time. Normal writing occurs only to one array. Additional test data bus leads on the chip carry test data signals from selected arrays to comparison circuits. The outputs of the comparison circuits flow to the output circuits of the chip. This achieves writing test data to four times the number of arrays as in a normal write and reading test data from twice the number of arrays as in a normal read operation.