The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 08, 1999
Filed:
Jul. 15, 1997
Dennis D Phillips, Richardson, TX (US);
Brian H Jones, Richardson, TX (US);
Vistech Corporation, Richardson, TX (US);
Abstract
A vision inspection system is provided in which eight optical images are instantaneously recorded on singular image frames which are output from two optical cameras. An illumination source is provided for illuminating four spaced apart inspection regions which are disposed about an inspection window. Two optical signals of reflected light emanate from each of the four inspection regions and are directed toward two optical cameras, with the two optical signals from each of the optical regions being at different viewing angles and preferably from a single focal point. Optical directing members receive the optical signals from the various regions and direct the light to respective ones of the cameras. The optical directing members are selectively adjustable for accommodating components of various sizes. The optical inspection of each component instantaneously occurs by recording the eight optical images, on two frames, one frame being recorded by each of the cameras. Four of the optical signals from two of the inspection regions are paired for input into one of the optical cameras and recorded on a singular frame. Four of the optical signals from the other two of the inspection regions are paired for input into the other of the optical cameras. The components passing over the optical inspection window may be inspected on the fly, without requiring stoppage of each of the components thereabove.