The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 01, 1999
Filed:
Sep. 22, 1997
Ping-Chin Cheng, Williamsville, NY (US);
Donald L Snyder, Clayton, MO (US);
Joseph A O'Sullivan, St. Louis, MO (US);
Ge Wang, Iowa City, IA (US);
Michael W Vannier, Alton, IL (US);
University of Iowa Research Foundation, Iowa, IA (US);
Washington University, St. Louis, MO (US);
Research Foundation of State of NY, Amherst, NY (US);
Abstract
In the present invention, an iterative process is provided for cone-beam tomography (parallel-beam and fan-beam geometries are considered as its special cases), and applied to metal artifact reduction and local reconstruction from truncated data, as well as image noise reduction. In different embodiments, these iterative processes may be based upon the emission computerized tomography (CT) expectation maximization (EM) formula and/or the algebraic reconstruction technique (ART). In one embodiment, generation of a projection mask and computation of a 3D spatially varying relaxation factor are utilized to compensate for beam divergence, data inconsistence and incompleteness.