The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 01, 1999
Filed:
Jul. 02, 1997
Applicant:
Inventors:
Steven H Kelem, Los Altos Hills, CA (US);
Charles R Erickson, Fremont, CA (US);
Assignee:
Xilinx, Inc., San Jose, CA (US);
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
371 2232 ; 365201 ;
Abstract
A scan lookahead skip structure that allows a programmable number of test bits, I/O blocks, flip-flops, or columns to be skipped. One embodiment of the structure includes multiplexers to skip the scan paths for several adjacent I/O blocks, flip-flops, or columns, thereby reducing the number of clock cycles and overall delay required to utilize the scan path.
Kelem, Steven. (1999). Lookahead structure for fast scan testing (U.S. Patent No. 5909453). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5909453
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile