The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 01, 1999
Filed:
Mar. 17, 1997
David M Pepper, Malibu, CA (US);
Gilmore J Dunning, Newbury Park, CA (US);
Thomas R O'Meara, Malibu, CA (US);
Hughes Electronics Corporation, El Segundo, CA (US);
Abstract
A dual time delay interferometer (TDI) enables remote sensing of phase modulated information, such as the detection of ultrasonic vibrations from highly diffuse surfaces, preferably in the range from about 10 kHz to 100 MHZ or more. The system can also be configured in a transceive mode with a dual pass through a single TDI, which is well suited to optical communications. A non-steady-state photo-electromotive-force detector tracks the movement of interference fringes (whose position shifts as the surface vibrates), rather than their absolute position. A phased array of the sensors can be used for enhanced imaging applications requiring better signal/noise ratios, or alternatively, when lower power optical sources are employed.