The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 01, 1999
Filed:
Oct. 27, 1997
Naoki Isogai, Nishio, JP;
Koki Kato, Gamagori, JP;
Nobuharu Kobayashi, Gamagori, JP;
Mitsuhiro Gono, Toyokawa, JP;
Noriyuki Ishihara, Gamagori, JP;
Nidek Co., Ltd., Aichi, JP;
Abstract
An alignment detecting apparatus for detecting an alignment condition between an eye to be examined having approximately spherical surface or approximately toric surface and a device having a standard axial lines the apparatus comprising a target projecting optical system which includes a first target projecting optical system for projecting a first target with a predetermined angle relative to the standard axial line, and a second target projecting optical system for projecting a second target with a different angle compared with the angle of the first target projecting optical system relative to the standard axial lines of which at least one between the first and second targets is a target of a finite distances a detecting optical system for detecting positions of images of the first and second targets which are projected onto the eye by the first and second target projecting optical systems, and a judging device for judging the alignment condition based on results detected by the detecting optical system.