The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 01, 1999
Filed:
Mar. 31, 1988
David Peter Finch, Morgan Hill, CA (US);
Donald Anthony Bradley, Morgan Hill, CA (US);
Wiltron Company, Morgan Hill, CA (US);
Abstract
A graph of data samples in a graph field on the display, including a first coordinate axis, a second coordinate axis, a trace indicating characteristics of data samples with respect to the coordinate axes, and a plurality of markers indicating positions of respective data samples along the trace is displayed. The markers appear on the display in the form of a symbol and a marker annotation field and are positioned within the graph field adjacent the data sample to which they are tied. The positions of the marker fields of the plurality of markers are calculated according to a preferred orientation with respect to the trace and their respective data samples. Markers are identified for which the marker annotation field according to the calculated position, lie in whole or in part outside the graph field, or for which the marker annotation field overlaps a marker field of another marker in the plurality of markers. The position of each marker identified as lying in whole or in part outside the graph field is recalculated according to a second orientation with respect to the trace, and the position of each marker identified as overlapping with the marker field of another marker is recalculated so that it no longer overlaps with such marker field.
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