The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 01, 1999

Filed:

Oct. 30, 1997
Applicant:
Inventors:

Thomas K Lo, Tucson, AZ (US);

W Scott Johnston, Tucson, AZ (US);

Assignee:

Raytheon Company, Lexington, MA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01S / ;
U.S. Cl.
CPC ...
342159 ;
Abstract

A processor and method for discriminating against interference during target acquisition and reacquisition processing of densely cluttered images. The processor and method that adaptively estimates the feature probability density function of the interference from the image data. The estimated interference probability density function, along with target feature estimates are input to a Bayesian classifier that discriminates the interference from the target.


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