The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 01, 1999

Filed:

Apr. 27, 1998
Applicant:
Inventors:

Abram Klaas Roskam, Sleeuwijk, NL;

Jan Aart van Bekkum, Hoomaar, NL;

Vladimir Smychliaev, Dordrecht, NL;

Assignee:

Krohne AG, , CH;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01F / ;
U.S. Cl.
CPC ...
7386127 ; 7386129 ;
Abstract

The invention concerns and ultrasound flow rate measurement method by means of a measuring tube and at least two pairs of ultrasound transducers located on the measuring tube, in each case forming a measuring path, whereby the radial components of at least two measuring paths deviate from each other with respect to the axis of the measuring tube and in the case of which the measured value for the rate of flow of a flowing medium is determined from the velocity of the medium along at least two measuring paths. In accordance with the invention an ultrasound flow measuring method of this kind is further developed in that the eddy intensity in the medium is determined from the velocities of the medium along the measuring paths, the relation between angular momentum and axial momentum enters into the determination of the eddy intensity at least approximately, and the measured value for the rate of flow is corrected by means of the eddy intensity.


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