The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 25, 1999

Filed:

Jul. 31, 1996
Applicant:
Inventors:

Michael J Wrape, San Diego, CA (US);

Tommi Uhari, Oulu, FI;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
371 2231 ; 365201 ;
Abstract

An integrated circuit includes a plurality of internal devices that are tested by setting the states of their data registers to respective levels, first forming a known initialization value and then a functional data value. All the data registers used for testing are coupled as one or more shift registers and by clocking data through a serial scan path, test stimuli can be shifted in and results shifted out. The scan path connections are provided in addition to the usual functional operation signal connections. During functional operation, the data transitions in the scan path signals are disabled to reduce the power dissipation associated with driving the scan path signals.


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