The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 25, 1999
Filed:
Sep. 03, 1997
Frederick W Clarke, Madison County, AL (US);
Joseph K McDonald, Limestone County, AL (US);
Charles R Christensen, Limestone County, AL (US);
John A Grisham, Lauderdale County, AL (US);
The United States of America as represented by the Secretary of the Army, Washington, DC (US);
Abstract
The device and method for performing an optical Hall test provide means for on-destructive measurement of free carrier concentration or effective mass in semiconductor materials using Faraday rotation spectra. A beam emitted by a Fourier transform infrared (FTIR) spectrometer is transmitted through the sample that is mounted between a polarizer and analyzer and the opposite poles of a magnet before finally being incident on a detector. The ratio of the samples's transmission spectrum with the magnetic field on to that with the magnetic field off is converted, through a suitable mathematical formula, to Faraday rotation. The rotation is, then, plotted versus the square of the wavelength. The slope of the graph at longer wavelengths is directly proportional to the carrier concentration and the effective mass. With one known, the other can be easily determined.