The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 25, 1999
Filed:
Nov. 29, 1995
Applicant:
Inventors:
Bruce C Abraham, Limekiln, PA (US);
Patrick J Drummond, Hamburg, PA (US);
Assignee:
Lucent Technologies, Inc., Murray Hill, NJ (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
324760 ; 324754 ;
Abstract
A method and apparatus for testing of semiconductor chips. The method and apparatus having a fixture which includes electrical contacts and thermal contacts. The electrical contacts are configured to drive each of the chips in an operating or stressed condition. The thermal contacts are configured to maintain the chip at a desired temperature during testing.
Abraham, Bruce. (1999). Testing of semiconductor chips (U.S. Patent No. 5907246). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5907246
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile