The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 18, 1999

Filed:

Jun. 18, 1996
Applicant:
Inventor:

Jan Timmer, Eindhoven, NL;

Assignee:

U.S. Philips Corporation, New York, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K / ;
U.S. Cl.
CPC ...
382131 ; 382254 ; 382279 ; 378-4 ; 378 17 ; 378 23 ; 348 77 ;
Abstract

A patient (7) is irradiated by an X-ray source (1) in a computed tomography apparatus. The radiation is subsequently detected by the detector cells (5) of a position-sensitive X-ray detection system (4) and the intensities detected are applied to a computing device (16). Absorption as well as elastic and inelastic scattering of X-rays occur within the patient (7). The data acquired is corrected for elastic (coherent) scatter by deriving a deconvolution function from the elastic scatter function, which deconvolution function is applied to the data. The elastic scatter function is determined, for example by a computer simulation.


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