The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 18, 1999
Filed:
Jan. 21, 1997
Applicant:
Inventor:
Hideaki Minami, Hirakata, JP;
Assignee:
Tsubakimoto Chain Co., Osaka, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B / ;
U.S. Cl.
CPC ...
359618 ; 3562411 ; 359629 ;
Abstract
A method for inspecting the surface of an inspection object with a picked-up image obtained by entering light from the inspection object into an annular prism, and picking-up the light emitted from the prism, and an apparatus used for execution thereof. Also a prism composed of a columnar light permeable material, having a space of a circular truncated cone or a truncated pyramid opened at both axial end sides in its inside, to be used in this apparatus.
Minami, Hideaki. (1999). Surface inspection method, surface inspection apparatus, and prism (U.S. Patent No. 5905595). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5905595
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