The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 18, 1999

Filed:

May. 29, 1997
Applicant:
Inventors:

Hiroshi Nishizawa, Tokyo, JP;

Kazunori Ikegami, Tokyo, JP;

Kunio Madono, Tokyo, JP;

Eisaku Teratani, Tokyo, JP;

Satoshi Senoo, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01T / ;
U.S. Cl.
CPC ...
250368 ; 250367 ;
Abstract

In a depth dose measuring device, a light is outputted from an end surface of a block-type detector (202) formed by tying a plurality of scintillation fibers in a bundle, a spectroscope (204) is used to disperse the light so as to measure an amount of light having a wavelength corresponding to an emission spectrum of the scintillation fibers, a picture measuring device (205) and a picture processing device (206) calculate an emission distribution of only a scintillation light depending upon an emission distribution in which the scintillation light and a Cerenkov light are mixed, and a result is displayed on a display device (207).


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