The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 18, 1999
Filed:
Jul. 23, 1997
Edwin E Wikfors, Landenberg, PA (US);
Charles N Carter, Newark, DE (US);
Hewlett-Packard Company, Palo Alto, CA (US);
Abstract
Method and apparatus are provided for peak identification of sample peaks in a chromatogram, wherein at least one group of standard peaks in standard peak series is matched to at least one group of sample peaks in a sample peak series so as to perform proper identification of the sample peaks in the sample peak group. In a preferred method, a succession of retention time windows are determined according to the characteristic retention times of the standard peaks and according to steps for determining shift, stretch, and distort parameters. The retention time windows are located with respect to the sample peak series and in accordance with the shift, stretch, and distort parameters so as to capture only certain ones of the sample peaks in the sample peak series. The shift, stretch, and distort parameters are used to position the retention time windows for improved matching of the standard peaks in the standard peak group to the captured sample peaks.