The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 18, 1999
Filed:
Mar. 17, 1998
Ernst Markart, Munich, DE;
LRE Technology Partner GmbH, Munich, DE;
Abstract
In a test strip package having a plurality of test strips (20), each of which test strips has a test field (32) for evaluation by an optical measuring mechanism of a measuring device and including a container (12) for receiving the test strips (20) the container (12) is made as a rectangular closed flat envelope (12) for receiving a rectangular card (18), with the card (18) consisting of a plurality of test strips (20) which are separable from one another along tear lines (22). The measuring device comprises a device housing (38) with a test strip support surface (40) as well as a measuring optic system, an evaluation and control circuit and an indicator unit (42) contained in the housing, with the test strip surface (40) having a stop (44) for reception in a recess (30) in the envelope (12) as well as a stop (46) which is so positioned relative to the measuring optic system that upon the placement of a predetermined spot of a test strip (20) onto the stop (46) the test field (32) of the test strip (20) lies in the area of the measuring beam of the measuring optic system.