The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 11, 1999

Filed:

Sep. 16, 1996
Applicant:
Inventor:

Mark Douglas Marik, Charlotte, NC (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F / ;
U.S. Cl.
CPC ...
39518314 ;
Abstract

A remote program monitor method and system using a system-under-test microcontroller for self-debug comprises a system-under-test (SUT) that includes a read-only memory (ROM) and a microcontroller for executing a program under test. The microcontroller has an interrupt input, wherein one or more enable debugger signals received at the interrupt input causes the microcontroller to execute a debugger program contained in the ROM. The SUT is connected with a host computer over a standard serial connection. When the SUT receives one or more debugger signals as an interrupt input, the signal causes the microcontroller to execute a debugger program contained in the ROM.


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