The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 11, 1999

Filed:

May. 24, 1996
Applicant:
Inventors:

Tokuya Osawa, Tokyo, JP;

Hideshi Maeno, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
371 2231 ;
Abstract

A connection circuit (CC) is formed by selectors (2,3) and a flip-flop (4). Th selectors (2,3) are switch-controlled by a test holding control signal (thld) and a shift mode control signal (sm) respectively. A scan-in terminal (si) is connected to a data input 0 terminal of the selector (2), while an output terminal of the flip-flop (4) is connected to its data input 1 terminal. An output terminal of the selector (2) is connected to a data input 1 terminal of the selector (3). An input terminal (d) is connected to a data input 0 terminal of the selector (3). An output terminal of the selector (3) is connected to an input terminal of the flip-flop (4). The output terminal of the flip-flop (4) is also connected to a scan-out terminal (so) and an output terminal (q) of the connection circuit (CC). In an ordinary operation, data is inputted through the input terminal (d). Thus, a scan path forming circuit attaining a high-speed operation in an ordinary operation is provided.


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