The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 11, 1999

Filed:

Jun. 06, 1997
Applicant:
Inventors:

Paul Joseph Stewart, Ann Arbor, MI (US);

Yifan Chen, Ann Arbor, MI (US);

Assignee:

Ford Global Technologies, Inc., Dearborn, MI (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F / ;
U.S. Cl.
CPC ...
36446804 ; 36446803 ; 36446825 ; 36447405 ; 36447424 ; 395118 ; 395119 ;
Abstract

An improved Direct Surface Manipulation (DSM) method is disclosed which incorporates a global surface reparametrization scheme for the purposes of extending the DSM method to applications involving multiple surfaces and for reducing the geometric effect of parametric space distortions on the features. This method reparametrizes multiple surface patches with a shared two-dimensional space defined in the object space of the model. The result is a geometrically consistent mesh, called a super-mesh, that serves as a global, uniform parametric space for topologically-disconnected, geometrically-disproportional surface patches. Spherical projection is employed to perform the patch reparametrization. This allows the creation of DSM features on multiple surface patches with improved shape quality.


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