The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 11, 1999
Filed:
Mar. 30, 1995
Franz Schwarz, Glottertal, DE;
Erwin Sick GmbH Optik-Elektronik, Waldkirch/Breisgau, DE;
Abstract
Method for checking a predetermined monitoring area, wherein at least one distance sensor provided in particular in the edge region of the monitored area, which transmits a scanning beam which sweeps over the monitored area in a predetermined scanning movement and thereby changes its direction, which receives the scanning beam which is reflected at boundaries of the monitored area and/or at objects located in the monitored area, and which determines a distance signal representative of the distance of the point of reflection of the scanning beam from the distance sensor and also a direction signal representing the direction of the scanning beam. The distance signals and the direction signals found during the scanning movement define a distance contour function, and an evaluation unit connected to the distance sensor compares the distance contour function which has been found with at least one stored reference contour function representing an expected object contour. Moreover, the evaluation unit generates an output signal, providing the distance contour function which has been found and the reference contour function correspond, or do not correspond, within preset tolerance limits.