The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 11, 1999

Filed:

Jun. 10, 1997
Applicant:
Inventors:

Akio Sakurai, Tokyo, JP;

Hisashi Tsukada, Tokyo, JP;

Takeshi Suzuki, Tokyo, JP;

Nobusuke Obata, Tokyo, JP;

Jun Suehiro, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B / ;
U.S. Cl.
CPC ...
351200 ; 351205 ;
Abstract

An ophthalmologic apparatus comprises a measuring instrument (1) for measuring a subject's eye and an ophthalmologic-data forming instrument (2) for forming ophthalmologic data which is obtained by adding kind data showing the kind of the measuring instrument (1) to measurement data measured by the measuring instrument (1). The ophthalmologic-data forming instrument (2) comprises a memory (2c) for storing the measurement data, a memory (2b) for storing the kind data, and a control unit (2a) for forming and outputting the ophthalmologic data from the data stored in the memories (2b, 2c).


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