The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 11, 1999

Filed:

Apr. 17, 1997
Applicant:
Inventors:

Min-Chung Jon, Princeton Junction, NJ (US);

Vito Palazzo, Hamilton Township, NJ (US);

Assignee:

Lucent Technologies Inc., Murray Hill, NJ (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G08B / ;
U.S. Cl.
CPC ...
340600 ; 340635 ; 340649 ; 324 72 ; 324457 ;
Abstract

Detection of the existence, magnitude, and frequency of occurrence of a plurality of ESD events is achieved by using an envelope detector to process signals generated by ESD events and received by an antenna. The ESD event detector includes an antenna for producing a signal waveform in response to electromagnetic fields incident thereupon, a demodulator coupled to the antenna for generating an envelope waveform that is related to the envelope of the signal waveform, a threshold window discriminator coupled to the demodulator for generating an indication signal if the envelope detected by the demodulator has a magnitude between a first and a second threshold, and a counter coupled to the threshold window discriminator for counting the number of indication signals received from the threshold window detector.


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