The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 04, 1999

Filed:

Jun. 03, 1996
Applicant:
Inventors:

Dallas W Meyer, Burnsville, MN (US);

Subrahmanyan Nagarajan, Burnsville, MN (US);

Bo Wei, Daly City, CA (US);

Assignee:

Seagate Technology, Inc., Scotts Valley, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11B / ; G11B / ;
U.S. Cl.
CPC ...
360 25 ; 360 31 ;
Abstract

A tester for use in detecting asperities in a disc surface of a storage system includes a load arm having a proximal end and a distal end. The distal end of the load arm is positioned adjacent the disc surface. A slider is carried on the distal end of the load arm adjacent the disc surface. A thermal sensor is coupled to the slider and provides an electrical output in response to a thermal input due to interaction between the thermal sensor and asperity on the disc surface. Detection circuitry coupled to the thermal sensor detects the electrical output from the thermal sensor and responsively provides a detection output indicating the occurrence of an asperity on the disc surface.


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