The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 04, 1999
Filed:
Nov. 08, 1996
Peisen S Huang, Nesconset, NY (US);
The Research Foundation of State University of New York, Albany, NY (US);
Abstract
A laser measurement system for rapid calibration of machine tools includes a measurement enhancement device which enables an existing standard single degree of freedom laser interferometry system to simultaneously measure up to four additional degrees of freedom. The device includes a first beamsplitter which splits a laser beam of the existing system, and a measurement component which receives the split beam and senses at least one value for at least a second degree of freedom. The beamsplitter and measurement component are mounted in a compact housing which is configured for attachment to the existing system. The measurement component can employ a new type of compact angle measurement device according to the invention. The new angle measurement device is based on the internal reflection effect and requires only a single prism for each angular component to be measured.