The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 04, 1999
Filed:
Dec. 16, 1996
Karen R Tubergen, Mt. Prospect, IL (US);
Nalco Chemical Company, Naperville, IL (US);
Abstract
The present invention provides a method of monitoring a papermaking system and unit operations contained therein to optimize the overall papermaking process. The method comprises employing a fluorescent tracer that is selectively carried through the entire papermaking system or in a specific unit operation and is sufficiently inert and sufficiently stable under the environmental and chemical conditions of the system from its addition point to the sampling point. A sample is withdrawn from the papermaking environment (either via `grab` or on-line side stream sampling) and the withdrawn sample subjected to analysis. The analysis comprises comparing the tracer concentration to a standard to determine the concentration of tracer in the sample and/or determining the time of first appearance of said tracer from addition point to the sampling point and/or subsequent decay of said tracer concentration at the sampling point. Finally, from this information process variables are adjusted to ensure stable paper machine operations and a high standard of paper quality.