The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 27, 1999

Filed:

Mar. 11, 1997
Applicant:
Inventors:

Fumio Ohtomo, Tokyo-to, JP;

Satoshi Hirano, Tokyo-to, JP;

Assignee:

Kabushiki Kaisha TOPCON, Tokyo-to, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B / ;
U.S. Cl.
CPC ...
3561413 ; 3561411 ;
Abstract

A laser survey instrument according to the present invention comprises at least an object reflector detecting unit for irradiating a detection laser beam, a main body rotating unit for rotating the object reflector detecting unit, and an object reflector for reflecting the detection laser beam toward the object reflector detecting unit, whereby said object reflector detecting unit comprises a light emitter for emitting said detection laser beam, a rotator for irradiating the laser beam for reciprocal scanning, a reflection light detecting unit for receiving and detecting the reflection laser beam from the object reflector, and a scanning controller for controlling said rotator, and the object reflector detecting unit detects the object reflector and determines the direction of the object reflector detecting unit by the main body rotating unit and automatically sets the direction of the laser survey instrument.


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