The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 27, 1999
Filed:
Mar. 10, 1997
David M Heffelfinger, San Pablo, CA (US);
Craig Van Horn, Sebastapol, CA (US);
Bio-Rad Laboratories, Inc., Hercules, CA (US);
Abstract
A method and apparatus for correcting non-uniformities in the source and the lens assembly of an electrophoresis apparatus is provided. Assuming a detector with a uniform responsivity, correcting for source and lens non-uniformities allows quantitative measurements of an electrophoresis gel to be made, thus increasing the information which can be obtained from an electrophoretic analysis. The non-uniformities due to the illumination source are characterized by sampling a portion of the source with a linear detector array and creating a correction data file. In order to sample the source, a mirror or beamsplitter is appropriately positioned, for example along the central optical axis of the electrophoresis apparatus. Similarly, a correction data file representing the non-uniformities due to the lens assembly is created using a secondary linear source of known uniformity. After the correction data files are stored, an image of the sample is taken and a sample data file is created. The sample data file can be normalized using the correction data files thereby creating a corrected sample file which can either be displayed or stored for future use.