The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 27, 1999
Filed:
Jan. 31, 1997
Stephen T Flock, Little Rock, AR (US);
Scott Ferguson, Vilonia, AR (US);
John L Dornhoffer, Roland, AR (US);
The Board of Trustees of the University of Arkansas, Little Rock, AR (US);
Abstract
A vibrometer which detects the variation of the speckle interference pattern of reflected waves as a means of determining the amplitude and frequency of vibrations of structures, including small anatomical structures. A wave source such as a laser delivers wave radiation to the object whose vibration is to be measured. The diffuse reflectance from the textural surface of the object reflects the incident wave radiation as a speckle interference pattern which is detected by a detector, such as a photodetector. The wave radiation source may be a continuous-wave laser, and the photodetector detector may be a phototransistor connected to a wide-bandwidth amplifier. As the object vibrates, the speckle interference pattern moves. The variation in the speckle interference pattern across the detector carries amplitude and frequency information regarding the vibrating object.