The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 20, 1999

Filed:

Jul. 24, 1997
Applicant:
Inventors:

Isao Okuda, Tokyo, JP;

Toshiyuki Kase, Kanagawa-ken, JP;

Hiroshi Nishikawa, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11B / ;
U.S. Cl.
CPC ...
369112 ; 369 4423 ; 369 53 ; 356359 ;
Abstract

A lens adjustment system including a interferometer and an adjustment unit is used for adjusting an inclination of a lens of an optical data recording/reproducing device. The interferometer detects an inclination angle of the objective lens, then, the inclination of the lens is adjusted at the adjustment portion. There are two light sources: one is for the interferometer; and the other is for monitoring the inclination adjustment. The inclination adjustment unit has an optical element which prevents the beam projected toward the interferometer from being incident on an image receiving surface of the monitoring system, and only the beam for monitoring the inclination adjustment is observed when the inclination of the lens is being adjusted.


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