The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 20, 1999
Filed:
Dec. 18, 1997
Eiichi Yanagi, Tokyo, JP;
Yukio Ikezawa, Tokyo, JP;
Kabushiki Kaisha Topcon, Tokyo, JP;
Abstract
A lens meter is provided which includes a light source portion (20) with a first light source (21) for generating a lens-characteristic measuring light beam (P2) and a second light source (23) for generating a position specifying light beam (P1). A patterning plate (28) with lens-characteristic measuring patterns (28c) and position specifying patterns (28b) is disposed in an optical path (31) of the lens-characteristic measuring light beam (P2) and position specifying light beam (P1) generated by the light source portion (20). The measuring light beam (P2) is projected onto a subject lens (30) set in the optical path (31) so that the images (28c') of the lens-characteristic measuring pattern (28c) are received. The received images (28c') are analyzed, and the lens-characteristic mapping display of the subject lens (30) is performed. In this lens meter, the first and second light sources (21, 23) are separate from each other.