The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 20, 1999
Filed:
Oct. 15, 1996
Jay L Fisher, San Antonio, TX (US);
Keith S Pickens, San Antonio, TX (US);
Southwest Research Institute, San Antonio, TX (US);
Abstract
A method utilizing high-speed digital computers and high resolution display systems for stacking a plurality of two-dimensional complex displays acquired from individual NDE scans over the surface of a material being inspected. The solid three-dimensional image constructed incorporates the two dimensions typically provided by eddy current-type testing components, i.e., the imaginary or vertical component and the real or horizontal component, and a third dimension that represents the physical orthogonal distance between sequential scans. The solid three-dimensional image is generated by connecting corresponding positional points on adjacent two-dimensional plane displays. The closed solid figure generated results when a null or equilibrium point away from the specific signal features is encountered. Appropriate coloration or shading on the three-dimensional image highlights the features for visual inspection. The method thus provides a representation of all of the data generated by eddy current-type or other NDE probes in a form that allows visualization of the relevant characteristics of the anomaly that permit its identification and relative importance.