The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 20, 1999
Filed:
Dec. 23, 1996
Ruben Yomtoubian, Saratoga, CA (US);
Hitachi Computer Products (America ), Inc., Santa Clara, CA (US);
Abstract
The present invention is an inline tester for analyzing the integrity of a disk drive. Structurally, the inline tester includes a set of statistical and diagnostic routines included in the ROM of a disk drive and a diagnostic logic section included in the drive's logic board. In initial use, the inline tester reconfigures the drive, making the drive less tolerant of flaws within the drive's media. The drive is also reconfigured to enable error detection and disable error correcting codes as well as device retries. Each sector of the media is then tested with multiple test patterns and failing sectors are added to a list of suspected sectors. At the conclusion of testing, the drive is restored to its normal operating configuration with error correcting codes and device retries enabled. Later, each sector in the list of suspected sectors is re-tested. Sectors that fail are added to the drive's list of bad sectors and are replaced by an alternate sector allocated from a reserved portion of the drive.