The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 13, 1999
Filed:
Aug. 29, 1997
Satoru Okinishi, Utsunomiya, JP;
Shinya Tanaka, Tokyo, JP;
Yasuyuki Numajiri, Kawasaki, JP;
Toshiaki Okumura, Yokohama, JP;
Shigeaki Ono, Utsunomiya, JP;
Hiroshi Itoh, Utsunomiya, JP;
Tomoyuki Iwanaga, Yokohama, JP;
Canon Kabushiki Kaisha, Tokyo, JP;
Abstract
A eye fundus examining apparatus includes a first optical system for projecting measurement light onto the fundus of an eye, a deflecting member provided in the first optical system for deflecting the measurement light, a light receiving element for receiving the reflected light of the measurement light from the fundus of the eye, a predetermined parameter of a target on the fundus of the eye being measured from the light reception information of the light receiving element, a second optical system for projecting a tracking light beam to an area including the target on the fundus of the eye, an image pickup element for receiving the image of the target illuminated by the tracking light beam, and a control system for driving the deflecting member and directing the measurement light onto the target so that the distance of deviation from the illuminated point by the measurement light under an ideal condition on the fundus of the eye to the target image received on the image pickup element may become a set value, the set value being suitably resettable.