The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 13, 1999

Filed:

Feb. 12, 1996
Applicant:
Inventors:

Frederick Charles Wellstood, Lanham, MD (US);

Yonggyu Gim, College Park, MD (US);

Randall Christopher Black, San Diego, CA (US);

Steven M Green, Greenbelt, MD (US);

Assignee:

University of Maryland, College Park, MD (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R / ; G01R / ; G01N / ; G01J / ;
U.S. Cl.
CPC ...
324248 ; 250330 ; 2503381 ; 324226 ; 324235 ; 324240 ; 324261 ; 324262 ; 324457 ; 324750 ; 382147 ; 505160 ; 505842 ; 505846 ; 505849 ;
Abstract

A cryogenic apparatus for microscopy of physical properties of an object including a thin, stiff, transparent substrate or window within the outer wall of the vacuum space of a dewar and a cryogenic sensor within the vacuum space and spaced very close distances to the window. This construction allows for positioning a sample for measurement outside of the vacuum space, at room temperature or higher and for microscopy of physical properties of the sample by monitoring the output from the cryogenic sensor as it is scanned along the surface of the sample.


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