The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 13, 1999
Filed:
Jan. 06, 1998
Applicant:
Inventors:
Eric A Lindgren, Gaithersburg, MD (US);
Moshe Rosen, Rockville, MD (US);
Harold Berger, Gaithersburg, MD (US);
Assignee:
Industrial Quality, Inc., Gaithersburg, MD (US);
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
73598 ;
Abstract
In a method for obtaining near-surface characteristics of a material, a series of single frequency ultrasonic Rayleigh waves are generated, with a generating system, in the material. The Rayleigh waves are detected with a detection system remote from the generating system. Velocities of the detected Rayleigh waves are determined at the selected frequencies. A depth profile of one or more characteristics of the material is prepared based on the determined Rayleigh wave velocities.