The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 06, 1999

Filed:

Jul. 01, 1996
Applicant:
Inventors:

Rance J DeLong, Los Gatos, CA (US);

Jaya R Carl, San Jose, CA (US);

Assignee:

Sun Microsystems, Inc., MS Palol, US;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
395701 ; 364578 ;
Abstract

A test support tool system and method produce software test programs from a logical description of selected software. Test programs are created by producing a cause-effect graph from the logical description, creating a decision table, producing test cases, and synthesizing test cases into a test program. The test support tool system includes an interface for receiving a logical description of software, a logical database, an analysis and test case generation module, a control module, and a test program synthesis module.


Find Patent Forward Citations

DeLong, Rance. (1999). Test support tool system and method (U.S. Patent No. 5892947). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5892947

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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