The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 06, 1999
Filed:
Jul. 02, 1997
Yoshinobu Hosoi, Aichi, JP;
Hirohisa Terabe, Aichi, JP;
Nidek Co., Ltd., Aichi, JP;
Abstract
The invention relates to an optometric apparatus the operation of which is not troublesome, and which is capable of effecting examination with high efficiency. An optometric apparatus for obtaining a correction power of refraction by examining the refractive power of an eye to be examined, comprising: a refractive-power examining device for examining the refractive power of the eye to be examined by selectively disposing in a test window corrective optical systems having various optical characteristics; storage memory for storing a plurality of different items of examination information; a display screen for displaying the examination information stored in the storage memory; and a control mechanism for providing control such that the plurality of items of examination information stored in said storage memory are displayed on the display screen, together with examination information of a present examination item.