The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 30, 1999

Filed:

Feb. 09, 1996
Applicant:
Inventors:

Takayoshi Tanimura, Tokyo, JP;

Tadashi Iokibe, Mishima, JP;

Yasunari Fujimoto, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F / ; G05B / ;
U.S. Cl.
CPC ...
706 12 ; 39518401 ;
Abstract

A monitoring apparatus for monitoring an operating condition of a system includes a predicting section which generates a data vector whose parameter is determined by a timeseries data of the system and which obtains a prediction value of the timeseries data of a predetermined time future by means of the chaotic inference based on a behavior of attractor which is generated in a reconstruction space by an embedding operation of the data vector. A monitoring section compares the detected value and the prediction value of the timeseries data and decides the condition of the observed system according to the compared result. Therefore, it becomes possible to appropriately and quickly judge as to whether the observed system is in an abnormal condition or not.


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