The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 30, 1999
Filed:
Jun. 28, 1996
Applicant:
Inventor:
Masaru Sanada, Tokyo, JP;
Assignee:
NEC Coporation, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02R / ;
U.S. Cl.
CPC ...
371 28 ; 371 251 ;
Abstract
In a system for estimating a failure mode in a semiconductor device, at least one special functional test pattern is generated and transmitted to the semiconductor device. If an abnormal current is detected, V-I characteristics of the semiconductor device are detected, and are compared with reference V-I characteristics for a special failure mode, thereby estimating that the specified failure mode has occurred.