The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 23, 1999
Filed:
Oct. 20, 1997
Robert E Grace, Fairport, NY (US);
Xerox Corporation, Stamford, CT (US);
Abstract
Reload characteristics of a development member such as a donor roll are monitored by using a machine exposure system (ROS or LED Bar) to generate a test image composed of a short (in the process direction) high density solid area patch followed by a long mid and lower density areas (solid or halftone), the later corresponding to Reload Defect (RD) exhibited by the development member. Typical dimensions of the test image would be a 15 mm square high density patch followed by a 200.times.15 mm mid and lower density regions. This test image voltage profile is placed in a skipped image frame inserted into a long job, or is effected during cycle-out/down following a shorter job run, and is scheduled at infrequent periodic intervals, for example, every 2000 prints. The resultant developed toner pattern on the photoreceptor is monitored, for example, with a reflectance or transmission density sensor such as the Toner Area Coverage (TAC) sensor used in the 4700.TM., 4850.TM., and 5775.TM. imaging products or an Extended Toner Area Coverage (ETAC) sensor. The toner dispense rate is adjusted to obtain a desired level of Reload Defect in the developed toner patter which corresponds to the optimum level of Toner Concentration in the development system.