The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 23, 1999

Filed:

Sep. 10, 1996
Applicant:
Inventors:

Gregory L Ranson, Fort Collins, CO (US);

Russell C Brockmann, Fort Collins, CO (US);

Douglas B Hunt, Fort Collins, CO (US);

Assignee:

Hewlett-Packard Company, Palo Alto, CA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F / ;
U.S. Cl.
CPC ...
371 251 ; 364579 ;
Abstract

Method for efficiently and flexibly comparing a group of multi-bit binary fields with a multi-bit expected pattern to generate a set of final match results, one final match result for each binary field in the group. Sets of of bit-wise comparator results are generated, one set for each binary field, by comparing each binary field with the expected pattern. Then, sets of bit-wise mask results are generated for each binary field by bit-wise masking each set of bit-wise comparator results with a mask pattern. Then, a set of preliminary match results is generated. Each preliminary match result is equal to the logical AND of all bits making up the bit-wise mask result set for the corresponding binary field. Then, a set of secondary match results is generated by negating all of the preliminary match results if a negate indicator is asserted. Finally, a set of final match results is generated, one final match result for each binary field, by individually gating all of the secondary match results with a separate enable indicator for each binary field. The invention includes an M.times.N comparator matrix for accomplishing the just-described method. The invention also includes circuitry for comparing N binary fields with an expected pattern to generate N comparison results.


Find Patent Forward Citations

Loading…