The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 23, 1999
Filed:
Mar. 11, 1997
Applicant:
Inventor:
Noboru Amemiya, Chigasaki, JP;
Assignee:
Nikon Corporation, Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B / ;
U.S. Cl.
CPC ...
359656 ; 359657 ; 359658 ; 359659 ; 359660 ; 359661 ;
Abstract
Provided is a microscope objective including a plurality of meniscus lenses disposed along a predetermined optical axis; a plurality of first doublets aligned along the optical axis and disposed behind the plurality of meniscus lenses; and a plurality of second doublets aligned along the optical axis and disposed behind the plurality of first doublets, wherein a distance between a rearmost one of the first doublets and a front one of the second doublets is larger than a distance between any two adjacent ones of the first doublets and a distance between any two adjacent ones of the second doublets.