The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 23, 1999
Filed:
Oct. 02, 1997
Herve Lefevre, Paris, FR;
Philippe Martin, Pontchartrain, FR;
Bertrand Merigot, Paris, FR;
Bernard Laloux, Villepreux, FR;
Denis Mangeot, Aulnay-sur-Mauldre, FR;
Photonetics, Marly le Roi, FR;
Abstract
The invention relates to an optical spectrum analyzer of an incident light beam (101) and a process for analyzing the corresponding spectrum. The spectrum analyzer comprises addressing means (1), a diffraction grating (2), a reflecting dihedron (3), a device (4) for adjusting the rotation of the reflecting dihedron and reception means (5). A polarization separator (11) divides the incident beam (101) into a first and second parallel secondary beam (102, 104), of linearly polarized light along the directions parallel to and perpendicular to the grooves in the grating respectively, and a .lambda./2 plate (12) placed on the path of the first secondary beam (102) applies a perpendicular polarization direction to this beam. The grating diffracts the secondary beams (103, 104) a first time, the reflecting dihedron exchanges their directions, the grating diffracts them a second time, the .lambda./2 plate applies a 90.degree. rotation to the polarization state of the second secondary beam (110) and the separator recombines the secondary beams (109, 111) into a single main beam (112) returned to reception means.