The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 23, 1999
Filed:
Jun. 29, 1998
Tadashi Kajino, Okazaki, JP;
Osamu Mita, Gamagori, JP;
Nidek Company,Ltd., , JP;
Abstract
A lens meter comprising light sources for project luminous flux for measurement to a lens to be examined and a light receiving element for detecting the measuring luminous flux passed through the lens to be examined, wherein refractive characteristics of the lens is detected on the basis of the examined data by the light receiving element, the lens meter comprises a measurement target having predetermined patterns, device for moving the target to one of a plurality of arrangement positions on the optical path of the measuring luminous flux, device for selecting one position to which the measurement target is to be moved among a plurality of arrangement positions on the optical path on the basis of the examined data by the light receiving element, device for controlling the target moving device in accordance with the selection by the selecting device.