The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 23, 1999
Filed:
Oct. 29, 1996
Robert Krieg, Nuremburg, DE;
Siemens Aktiengesellschaft, Munich, DE;
Abstract
In a method of distortion correction for gradient non-linearities in a nuclear magnetic resonance tomography apparatus, two auxiliary datasets h(x,), f(x,y) are measured that describe the shift of a measured location (x',y') relative to an actual location (x,y) of a signal origin. A corrected auxiliary dataset h(x+f(x,y), y) is produced from the auxiliary dataset h(x,y). A location correction in y-direction ensues in an image dataset upon employment of the corrected auxiliary dataset h(x+f(x,y), y). A first intensity correction also ensues. A location correction in x-direction subsequently ensues with a second intensity correction. Alternatively, the location correction can also ensue by Fresnel transformation of the raw dataset upon involvement of the corrected auxiliary data h(x+f(x,y), y).