The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 23, 1999
Filed:
Dec. 11, 1997
Applicant:
Inventors:
W Mack Grady, Round Rock, TX (US);
Ricardo Chan, Carrollton, TX (US);
Gregorio C-Y Chung, Panama City, PA;
David Gerez, Bozeman, MT (US);
William Blane Leuschner, Smyrna, TN (US);
George P Olson, Chesapeake, VA (US);
Assignee:
Board of Regents, The University of Texas System, Austin, TX (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
307125 ; 307106 ; 324102 ; 324522 ; 324527 ; 327-2 ;
Abstract
A computer controllable testing and monitoring station forms short-term intervals of simulated alternating current power level disturbance, either undervoltage (sag) or overvoltage (swell). The station forms the short term voltage sags or swells so that their effects on sensitive equipment can be measured. The starting point of the sag or swell disturbance, as well as the time duration of the disturbance, can be accurately controlled.